![[IEEE 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Arlington, VA, USA (2007.04.12-2007.04.15)] 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - BIAS FREE FEATURES DETECTION FOR HIGH CONTENT SCREENING]()
[IEEE 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Arlington, VA, USA (2007.04.12-2007.04.15)] 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - BIAS FREE FEATURES DETECTION FOR HIGH CONTENT SCREENINGDorval, T.; Ogier, A.; Dusch, E.; Emans, N.; Genovesio, A. · 2007