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$Measurement of Microwave Diffraction from a Long Slit in a Thin Conducting Plane$

Measurement of Microwave Diffraction from a Long Slit in a Thin Conducting Plane

Hirshfield, Jay L.; Zieman, Clayton M.

期刊名称Journal of Applied Physics
作者Hirshfield, Jay L.; Zieman, Clayton M.
卷第26卷
期第2期
印刷ISSN0021-8979
文件大小383.74KB
发表时间1955
DOI10.1063/1.1721951

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