Inelastic Low-Energy Electron Diffraction Measurements on Al (111)J. O. Porteus · 1972

Pulsed laser-induced damage of metals at 492 nmMarrs, C. D.; Faith, W. N.; Dancy, J. H.; Porteus, J. O. · ao/21/22/ao-21-22-4063.pdf · 1982

<title>Defect Characteristics Of Optical Surfaces Using Pulsed Laser Damage Methods</title>Porteus, J. O. · Optical Engineering · 1986

Optimum RC Filtering and Integration for Sequential Measurement of dc SignalsPorteus, J. O. · Review of Scientific Instruments · 1964

Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceBENNETT, H. E.; PORTEUS, J. O. · josa/51/2/josa-51-2-123.pdf · 1961

Linear Unfolding Methods and Optimization for X-Ray and Similar SpectraPorteus, J. O. · Journal of Applied Physics · 1968

Abstract: Sodium adsorption on aluminum (100) and (111) surfaces: ELEED, Auger, and contact potential measurementsPorteus, J. O. · Journal of Vacuum Science and Technology · 1974

Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988

Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006

Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000

Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000

Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008

Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008

Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005

Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013