![SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Advances in Optical Interference Coatings - <title>New interferometric method for the complete determination of the properties of the light field scattered by a rough surface</title>]()
SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Advances in Optical Interference Coatings - <title>New interferometric method for the complete determination of the properties of the light field scattered by a rough surface</title>Lequime, Michel; Destouches, Nathalie; Giovannini, Hugues; Amra, Claude; Macleod, H. Angus · 1999