![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - The Maia detector array and x-ray fluorescence imaging system: locating rare precious metal phases in complex samples]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - The Maia detector array and x-ray fluorescence imaging system: locating rare precious metal phases in complex samplesLai, Barry; Ryan, C. G.; Siddons, D. P.; Kirkham, R.; Li, Z. Y.; de Jonge, M. D.; Paterson, D.; Cleverley, J. S.; Kuczewski, A.; Dunn, P. A.; Jensen, M.; De Geronimo, G.; Howard, D. L.; Godel, B.; Dyl, K. A.; Fisher, L. A.; Hough, R. H.; Barnes, Stephen J.; Bland, P. A.; Moorhead, G.; James, S. A.; Spiers, K. M.; Falkenberg, G.; Boesenberg, U.; Wellenreuther, G. · 2013