Bulk lifetime determination using an MOS capacitor
- 期刊名称Proceedings of the IEEE
- 作者Huang, J.S.T.
- 卷第58卷
- 期第11期
- 印刷ISSN0018-9219
- 文件大小185.20KB
- 发表时间1970
- DOI10.1109/proc.1970.8033
- 页码1849-1850
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