Energy-Conservation Considerations in the Characterization of Impact Ionization in Semiconductors
Okuto, Y.; Crowell, C. R.
- 期刊名称Physical Review B
- 作者Okuto, Y.; Crowell, C. R.
- 卷第6卷
- 期第8期
- 印刷ISSN0556-2805
- 文件大小378.55KB
- 发表时间1972-10-15
- DOI10.1103/PhysRevB.6.3076
- 页码3076-3081