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Energy-Conservation Considerations in the Characterization of Impact Ionization in Semiconductors

Energy-Conservation Considerations in the Characterization of Impact Ionization in Semiconductors

Okuto, Y.; Crowell, C. R.
  • 期刊名称Physical Review B
  • 作者Okuto, Y.; Crowell, C. R.
  • 卷第6卷
  • 期第8期
  • 印刷ISSN0556-2805
  • 文件大小378.55KB
  • 发表时间1972-10-15
  • DOI10.1103/PhysRevB.6.3076
  • 页码3076-3081
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