[untitled]
- 期刊名称The English Historical Review
- 作者Review by: Michael Angold
- 卷第87卷
- 期第345期
- 印刷ISSN0013-8266
- 电子ISSN1477-4534
- 文件大小357.31KB
- 发表时间1972-10
- DOI10.2307/562232
- 页码858-859
Uniform low defect density molecular beam epitaxial HgCdTeJ. Bajaj; J. M. Arias; M. Zandian; D. D. Edwall; J. G. Pasko; L. O. Bubulac; L. J. Kozlowski · 1996
GaAs charge-coupled devicesDeyhimy, I.; Harris, J. S.; Eden, R. C.; Edwall, D. D.; Anderson, S. J.; Bubulac, L. O. · Applied Physics Letters · 1978
Dependence of junction formation on substrate in implanted HgCdTeL. O. Bubulac · 1985
Behavior of implantation-induced defects in HgCdTeBubulac, L. O. · Journal of Vacuum Science and Technology · 1982
Enhanced arsenic diffusion and activation in HgCdTeS. H. Shin; J. M. Arias; M. Zandian; J. G. Pasko; L. O. Bubulac; R. E. De Wames · 1995
Ion implanted junction formation in Hg1−xCdxTeBubulac, L. O. · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · 1987
Characterization of Hg1−xCdxTe heterostructures by thermoelectric measurementsJ. Baars; D. Brink; D. D. Edwall; L. O. Bubulac · 1993
Characterization of CdTe for HgCdTe surface passivationL. O. Bubulac; W. E. Tennant; J. Bajaj; J. Sheng; R. Brigham; A. H. B. Vanderwyck; M. Zandian; W. V. Mc Levige · 1995
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992