Contributors, Jun. 1980Aikawa, M.; Akiyama, M.; Atwater, H.A.; Auckland, D.T.; Baars, R.D.; Bahl, I.J.; Bhartia, P.; Bhat, B.; Chakraborty, A.; Denlinger, E.J.; de Santis, P.; Enegren, T.A.; Freibergs, E.; Fukuda, O.; Gruner, L.; Hara, E.H.; Harrington, R.F.; Helszajn, J.; Horn, R.E.; Ino, M.; Jacobs, H.; Jokela, K.T.; Kato, Y.; Kharadly, M.M.Z.; King, R.W.P.; Kitayama, K.; Klohn, K.; Kumagai, N.; Kurita, O.; Laura, P.A.A.; Levy, R.; MacDonald, R.I.; Makimura, T.; Miyagi, M.; Nagaya, K.; Nisbet, W.T.; Nishida, S.; Ogawa, H.; Ohmori, M.; Prasad, S.; Saleh, A.A.M.; Sandler, B.H.; Sanyal, G.S.; Sarmiento, G.S.; Seikai, S.; Sharma, A.K.; Suzuki, H.; Takaoka, A.; Tsutsumi, M.; Uchida, N.; Ura, K.; Yamamoto, K. · 1980

Accuracy of temperature measurement in micro-areas of polycrystalline film with transmission electron microscopeTakaoka, A; Ura, K · Measurement Science and Technology · 1994

Development of a new 3 MV ultra-high voltage electron microscope at Osaka UniversityTakaoka, A.; Ura, K.; Mori, H.; Katsuta, T.; Matsui, I.; Hayashi, S. · Journal of Electron Microscopy · 1997

Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988

Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006

Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000

Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000

Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008

Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008

Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005

Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013