Holographic Nondestructive Evaluation of Interference Fit Fasteners
- 期刊名称ao/12/4/ao-12-4-885.pdf
- 作者Bartolotta, C. S.; Pernick, B. J.
- 卷第12卷
- 期第4期
- 印刷ISSN0003-6935
- 电子ISSN1539-4522
- 文件大小468.12KB
- 发表时间1973
- DOI10.1364/AO.12.000885
Solar cell spectral response characterizationZalewski, Edward F.; Geist, Jon · ao/18/23/ao-18-23-3942.pdf · 1979
The quantum yield of silicon in the visibleGeist, Jon; Zalewski, Edward F. · Applied Physics Letters · 1979
Physics of photon-flux measurements with silicon photodiodesGeist, Jon; Gladden, Warren K.; Zalewski, Edward F. · josa/72/8/josa-72-8-1068.pdf · 1982
Electrically based spectral power measurements through use of a tunable cw laserGeist, Jon; Steiner, Bruce; Schaefer, Russell; Zalewski, Edward; Corrons, Antonio · Applied Physics Letters · 1975
SPIE Proceedings [SPIE 23rd Annual Technical Symposium - San Diego (Monday 27 August 1979)] Measurements of Optical Radiations - <title>On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode</title>Geist, Jon; Field, Harold P.; Zalewski, Edward F.; Zweibaum, Frederic M. · 1979