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Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systems

Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systems

Tom J. Gray; R. Lear; R.J. Dexter; F.N. Schwettmann; K.C. Weimer

作者Tom J. Gray; R. Lear; R.J. Dexter; F.N. Schwettmann; K.C. Weimer
卷第19卷
期第1期
印刷ISSN0040-6090
文件大小673.35KB
发表时间1973
DOI10.1016/0040-6090(73)90028-x
页码103-119

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