Reactions
- 期刊名称Physical Review C
- 作者Goss, J. D.; Rollefson, A. A.; Browne, C. P.; Blue, R. A.; Weller, H. R.
- 卷第8卷
- 期第2期
- 印刷ISSN0556-2813
- 文件大小267.95KB
- 发表时间1973-8-1
- DOI10.1103/PhysRevC.8.514
- 页码514-517
[IEEE 2006 IEEE International Symposium on Industrial Electronics - Montreal, Que. (2006.07.9-2006.07.13)] 2006 IEEE International Symposium on Industrial Electronics - Converting PLC instruction sequence into logic circuit: A preliminary studyIchikawa, Shuichi; Akinaka, Masanori; Ikeda, Ryo; Yamamoto, Hiroshi · 2006
[IEEE 2006 IEEE International Symposium on Circuits and Systems - Island of Kos, Greece (21-24 May 2006)] 2006 IEEE International Symposium on Circuits and Systems - Linear switched-capacitor circuit theoremsEfthivoulidis, G. · 2006
[IEEE 2006 49th IEEE International Midwest Symposium on Circuits and Systems - San Juan, PR (2006.08.6-2006.08.9)] 2006 49th IEEE International Midwest Symposium on Circuits and Systems - Circuit Techniques for Operational Amplifier Speed and Accuracy Improvement: Analog Circuit Design with Structural MethodologyIvanov, Vadim V.; Filanovsky, Igor M. · 2006
[IEEE 2006 49th IEEE International Midwest Symposium on Circuits and Systems - San Juan, PR (2006.08.6-2006.08.9)] 2006 49th IEEE International Midwest Symposium on Circuits and Systems - Circuit Techniques for Operational Amplifier Speed and Accuracy Improvement: Analog Circuit Design with Structural MethodologyIvanov, Vadim V.; Filanovsky, Igor M. · 2006
[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Analyzing FPGA simultaneous switching noise in printed circuit boardsGeping Liu, ; Hong Shi, ; San Wong, ; Chang, A. · 2006
[IEEE 2006 IEEE International Symposium on Industrial Electronics - Montreal, Que. (2006.07.9-2006.07.13)] 2006 IEEE International Symposium on Industrial Electronics - An Advance Physics-Based Sub-Circuit Model of IGBTJankovic, Nebojsa; Zhou, Zhongfu; Batcup, Steve; Igic, Petar · 2006
[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Laser optical in-circuit measurement system for immunity applicationsChong Ding, ; Pommerenke, D. · 2006
[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Error Masking Circuit and Latch Using Schmitt Trigger CircuitSasaki, Yoichi; Namba, Kazuteru; Ito, Hideo · 2006