Damage Effects in Silicon Surface Barrier Detectors by 0.5-1.5 MeV Electrons
- 期刊名称Japanese Journal of Applied Physics
- 作者Nakamoto, Shunsuke; Aoki, Takashi; Kawabata, Keishi; Norisawa, Keizo; Sakisaka, Masakatsu
- 卷第12卷
- 期第10期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小858.54KB
- 发表时间1973-10
- DOI10.1143/jjap.12.1493
- 页码1493-1499
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