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[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Varennes, Quebec, Canada (1973.10.29-1973.10.31)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Semiautomated determination of dielectric permittivity and loss in the microwave region

[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Varennes, Quebec, Canada (1973.10.29-1973.10.31)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 - Semiautomated determination of dielectric permittivity and loss in the microwave region

Turner, E. M.; Ehrhardt, W. C.; Vaughan, W. E.

作者Turner, E. M.; Ehrhardt, W. C.; Vaughan, W. E.
文件大小2446.80KB
发表时间1973
DOI10.1109/eidp.1973.7683931
页码357-365

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