[IEEE 12th International Reliability Physics Symposium - Las Vegas, NV, USA (1974.04.2-1974.04.4)] 12th International Reliability Physics Symposium - Nichrome Resistor Failures as Studied by X-ray Photoelectron Spectroscopy (XPS or ESCA)

• 作者Baitinger, W. E.; Winograd, N.; Amy, J. W.; Munarin, J. A.
• 文件大小6975.58KB
• 发表时间1974
• DOI10.1109/IRPS.1974.362619
• 页码1-6