Measurement of kaonic X-rays from Al, Si, Ni and Cu

P.D. Barnes; R.A. Eisenstein; W.C. Lam; J. Miller; R.B. Sutton; M. Eckhause; J.R. Kane; R.E. Welsh; D.A. Jenkins; R.J. Powers; A.R. Kunselman; R.P. Redwine; R.E. Segel

作者P.D. Barnes; R.A. Eisenstein; W.C. Lam; J. Miller; R.B. Sutton; M. Eckhause; J.R. Kane; R.E. Welsh; D.A. Jenkins; R.J. Powers; A.R. Kunselman; R.P. Redwine; R.E. Segel
卷第231卷
期第3期
印刷ISSN0375-9474
文件大小991.78KB
发表时间1974
DOI10.1016/0375-9474(74)90511-9
页码477-492

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Measurement of kaonic X-rays from Al, Si, Ni and Cu