Instrumentation: Automatic test systems: Seven basic elements make up the ideal ATS; neglect of any one is an invitation to disaster
To, Kilin; Tulloss, R. E.
- 期刊名称IEEE Spectrum
- 作者To, Kilin; Tulloss, R. E.
- 卷第11卷
- 期第9期
- 印刷ISSN0018-9235
- 文件大小1743.33KB
- 发表时间1974
- DOI10.1109/mspec.1974.6366435
- 页码44-52