Analysis of Negative Resistance Based on Space-Charge-Layers Overlapping in Switching Diodes with Deep Impurity Levels
- 期刊名称Japanese Journal of Applied Physics
- 作者Hariu, Takashi; Ishikawa, Hidero; Shibata, Yukio
- 卷第13卷
- 期第11期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小534.07KB
- 发表时间1974-11
- DOI10.1143/JJAP.13.1828
- 页码1828-1836
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