Damage Effects in Silicon Surface Barrier Detectors with 0.5–2 MeV Protons
- 期刊名称Japanese Journal of Applied Physics
- 作者Nakamoto, Shunsuke; Aoki, Takashi; Kawabata, Keishi; Norisawa, Keizo; Sakisaka, Masakatsu
- 卷第13卷
- 期第3期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小678.16KB
- 发表时间1974-3
- DOI10.1143/JJAP.13.524
- 页码524-528
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