The Pattern of the Chinese Pastby Mark Elvin
Review by: John S. Major and David C. Major
- 期刊名称Technology and Culture
- 作者Review by: John S. Major and David C. Major
- 卷第15卷
- 期第3期
- 印刷ISSN0040-165X
- 电子ISSN1097-3729
- 文件大小169.37KB
- 发表时间1974-07
- DOI10.2307/3102978
- 页码511-514