Nachweis von Stapelfehlern in GaN-Epitaxieschichten mittels Elektronenbeugung
- 作者Dr. A. Tempel; Dr. W. Seifert
- 卷第10卷
- 期第7期
- 印刷ISSN0232-1300
- 电子ISSN1521-4079
- 文件大小356.63KB
- 发表时间1975
- DOI10.1002/crat.19750100707
- 页码741-746
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