![[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Impact of Sinter Process and Metal Coverage on Transistor Mismatching and Parameter Variations in Analog CMOS Technology]()
[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Impact of Sinter Process and Metal Coverage on Transistor Mismatching and Parameter Variations in Analog CMOS TechnologyWu, Xiaoju; Trogolo, Joe; Inoue, Flex; Chen, Zhenwu; Jones-Williams, Pam; Khan, Imran; Madhani, Praful · 2007