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Effect of electron scavengers on the yield of electrons in shallow and deep traps at 77 K

Effect of electron scavengers on the yield of electrons in shallow and deep traps at 77 K

Johan Moan; Harald B. Steen; Bjørn Høvik
  • 作者Johan Moan; Harald B. Steen; Bjørn Høvik
  • 卷第38卷
  • 期第2期
  • 印刷ISSN0009-2614
  • 文件大小412.56KB
  • 发表时间1976
  • DOI10.1016/0009-2614(76)85153-6
  • 页码275-278
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