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Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity changes with Auger electron spectroscopy and Rutherford backscattering profiles

Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity changes with Auger electron spectroscopy and Rutherford backscattering profiles

P.M. Hall; J.M. Morabito; J.M. Poate

作者P.M. Hall; J.M. Morabito; J.M. Poate
卷第33卷
期第1期
印刷ISSN0040-6090
文件大小1481.36KB
发表时间1976
DOI10.1016/0040-6090(76)90592-7
页码107-134

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