Imaging methods for infrared cathodoluminescence topographyLang, A R; Makepeace, A P W · Journal of Physics E: Scientific Instruments · 1977

Characterization of phosphorus doped CVD diamond films by cathodoluminescence spectroscopy and topographyKanda, H.; Watanabe, K.; Koizumi, S.; Teraji, T. · Diamond and Related Materials · 2003

Investigation of crystal defects in gaas by X-ray topography and SEM transmission cathodoluminescenceP. Franzosi; G. Salviati · 1983

Determination of material inhomogeneities in solar cell materials by high resolution cathodoluminescence topographyFelix Oehlschläger; Julian Müller; Ulrike Künecke; Astrid Hölzing; Roland Schurr; Rainer Hock; Peter Wellmann · 2010

Assessment of defects in as-grown III-V multilayer structures by differentiated cathodoluminescence topography (DCLT)J. Bakker; J. de Poorter; W. J. Bartels; T. v. Dongen; W. Nijman; W. T. Stacy · 1980

Structural characterisation of $(11{bar 2}0)$ 4H-SiC substrates by cathodoluminescence and X-ray topographyHidalgo, P.; Ottaviani, L.; Idrissi, H.; Lancin, M.; Martinuzzi, S.; Pichaud, B. · The European Physical Journal Applied Physics · 2004

Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescenceUmezawa, Hitoshi; Kato, Yukako; Watanabe, Hideyuki; Omer, Ashraf M.M.; Yamaguchi, Hirotaka; Shikata, Shin-ichi · Diamond and Related Materials · 2011