An investigation of information system utilization
- 作者Stephen R. Barkin; Gary W. Dickson
- 卷第1卷
- 期第1期
- 印刷ISSN0378-7206
- 文件大小1240.97KB
- 发表时间1977
- DOI10.1016/0378-7206(77)90007-6
- 页码35-45
Recent progress in the nondestructive analysis of surfaces, thin films, and interfaces by spectroellipsometryASPNES, D · Applied Surface Science · 1985
[AIP REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION:Volume 22 - Bellingham, Washington (USA) (14-19 July 2002)] AIP Conference Proceedings - Recent Studies on the POD Analysis of “â vs. a” NDI DataSafizadeh, M.-S. · 2003
Optically monitoring and controlling epitaxial growthD.E. Aspnes; R. Bhat; C. Caneau; E. Colas; L.T. Florez; S. Gregory; J.P. Harbison; I. Kamiya; D.E. Aspnes; R. Bhat; C. Caneau; E. Colas; L.T. Florez; S. Gregory; J.P. Harbison; I. Kamiya; V.G. Keramidas; M.A. Koza; M.A.A. Pudensi; W.E. Quinn; S.A. Schwarz; M.C. Tamargo; H. Tanaka · 1992
Optical properties of thin filmsD.E. Aspnes · 1982
Interface ellipsometry; an overviewD.E. Aspnes · 1980
Recombination at semiconductor surfaces and interfacesD.E. Aspnes · 1983
Plasmonics and effective-medium theoriesD.E. Aspnes · 2011
Refractive index dispersion in oxide glassesB.G. Bagley; D.E. Aspnes; J.W. Fleming · 1980
Interface ellipsometry: An overviewD.E. Aspnes · 1980
Recombination at semiconductor surfaces and interfacesD.E. Aspnes · 1983