Emerging display devices
- 作者Pucilowski, J.J., Jr.; Schlam, E.
- 卷第25卷
- 期第2期
- 文件大小665.00KB
- 发表时间1978
- DOI10.1109/t-ed.1978.19055
- 页码167-171
The analysis of residual gas in electron tubesFrost, H.B. · 1962
New methods for the measurement of cathode interface impedanceFrost, H.B. · 1959
The effect of injecting contacts on avalanche diode performanceDecker, D.R.; Dunn, C.N.; Frost, H.B. · 1971
The Gas Chromatograph Mass Spectrometer for the Huygens ProbeH.B. Niemann; S.K. Atreya; S.J. Bauer; K. Biemann; B. Block; G.R. Carignan; T.M. Donahue; R.L. Frost; D. Gautier; J.A. Haberman; D. Harpold; D.M. Hunten; G. Israel; J.I. Lunine; K. Mauersberger; T.C. Owen; F. Raulin; J.E. Richards; S.H. Way · 2002
Nitrate reduction over nanoscale zero-valent iron prepared by hydrogen reduction of goethiteH.B. Liu; T.H. Chen; D.Y. Chang; D. Chen; Y. Liu; H.P. He; P. Yuan; Ray Frost · 2012
[IRE 1960 International Electron Devices Meeting - ()] 1960 International Electron Devices Meeting - The analysis of residual gas in electron tubesFrost, H.B. · 1960