Atom-probe field-ion microscopy of GaAs and GaP
- 作者Ohno Youichi; Kuroda Tsukasa; Nakamura Shogo
- 卷第75卷
- 期第4期
- 文件大小899.58KB
- 发表时间1978
- DOI10.1016/0039-6028(78)90186-3
- 页码689-702
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