Mechanisms of Field Ionization and Field Evaporation on Semiconductor Surfaces
Ohno, Youichi; Nakamura, Shogo; Kuroda, Tsukasa
- 期刊名称Japanese Journal of Applied Physics
- 作者Ohno, Youichi; Nakamura, Shogo; Kuroda, Tsukasa
- 卷第17卷
- 期第11期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小182.74KB
- 发表时间1978-11
- DOI10.1143/JJAP.17.2013
- 页码2013-2022