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SPIE Proceedings [SPIE Industrial Applications of Solid State Image Scanners - London (Tuesday 14 March 1978)] Industrial Applications of Solid State Image Scanners - <title>Automated Surface Inspection With Solid-State Image Sensors</title>

SPIE Proceedings [SPIE Industrial Applications of Solid State Image Scanners - London (Tuesday 14 March 1978)] Industrial Applications of Solid State Image Scanners - Automated Surface Inspection With Solid-State Image Sensors

Purll, D. J.; Purll, David J.

作者Purll, D. J.; Purll, David J.
卷第145卷
印刷ISSN0277-786X
文件大小279.71KB
发表时间1978
DOI10.1117/12.956591
页码18-27

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