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SPIE Proceedings [SPIE 22nd Annual Technical Symposium - San Diego (Monday 28 August 1978)] Advances in Optical Metrology I - <title>Application Of Ronchi Interferometry To Testing Large Aperture Flat Mirrors</title>

SPIE Proceedings [SPIE 22nd Annual Technical Symposium - San Diego (Monday 28 August 1978)] Advances in Optical Metrology I - Application Of Ronchi Interferometry To Testing Large Aperture Flat Mirrors

Stoltzmann, David E.; Balasubramanian, N.; Wyant, James C.

作者Stoltzmann, David E.; Balasubramanian, N.; Wyant, James C.
卷第153卷
印刷ISSN0277-786X
文件大小7882.15KB
发表时间1978
DOI10.1117/12.938218
页码68-75

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