A quantitative monitor for beam intensity and polarization profiles
W. Haeberli; R. Henneck; Ch. Jacquemart; J. Lang; R. Müller; M. Simonius; W. Reichart; Ch. Weddigen
- 作者W. Haeberli; R. Henneck; Ch. Jacquemart; J. Lang; R. Müller; M. Simonius; W. Reichart; Ch. Weddigen
- 卷第163卷
- 印刷ISSN0029-554X
- 文件大小269.74KB
- 发表时间1979
- DOI10.1016/0029-554x(79)90125-3
- 页码403-413