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Observation of Si-2p Level Shift in Hydrogenated Amorphous Silicon by X-Ray Photoelectron Spectroscopy

Observation of Si-2p Level Shift in Hydrogenated Amorphous Silicon by X-Ray Photoelectron Spectroscopy

Usami, Katsuhisa; Shimada, Toshikazu; Katayama, Yoshifumi
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Usami, Katsuhisa; Shimada, Toshikazu; Katayama, Yoshifumi
  • 卷第19卷
  • 期第7期
  • 印刷ISSN0021-4922
  • 电子ISSN1347-4065
  • 文件大小358.47KB
  • 发表时间1980-7
  • DOI10.1143/JJAP.19.L389
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