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Quantitative analysis of buried interfacial impurity layers by SIMS and RBS

Quantitative analysis of buried interfacial impurity layers by SIMS and RBS

Peter Williams; Judith E. Baker; John A. Davies; Tom E. Jackman

作者Peter Williams; Judith E. Baker; John A. Davies; Tom E. Jackman
卷第191卷
印刷ISSN0167-5087
文件大小357.71KB
发表时间1981
DOI10.1016/0029-554x(81)91022-3
页码318-322

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