Semiconductor Analysis Using Finite Elements—Part II: IGFET and BJT Case Studies
- 作者G. D. Hachtel; M. H. Mack; R. R. O'brien
- 卷第25卷
- 期第4期
- 文件大小1080.92KB
- 发表时间1981
- DOI10.1147/rd.254.0246
- 页码246-260
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