Proton-magnetic-resonance studies of microstructure in plasma-deposited amorphous-silicon—hydrogen films
Reimer, Jeffrey A.; Vaughan, Robert W.; Knights, John C.
- 期刊名称Physical Review B
- 作者Reimer, Jeffrey A.; Vaughan, Robert W.; Knights, John C.
- 卷第24卷
- 期第6期
- 印刷ISSN0163-1829
- 文件大小486.39KB
- 发表时间1981-9-15
- DOI10.1103/PhysRevB.24.3360
- 页码3360-3370