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XPS measurement of GaAs–AlAs heterojunction band discontinuities: Growth sequence dependence

XPS measurement of GaAs–AlAs heterojunction band discontinuities: Growth sequence dependence

Waldrop, J. R.

期刊名称Journal of Vacuum Science and Technology
作者Waldrop, J. R.
卷第19卷
期第3期
印刷ISSN0022-5355
文件大小697.42KB
发表时间1981-9
DOI10.1116/1.571130

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