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SPIE Proceedings [SPIE Industrial Applications of Holographic Nondestructive Testing - Brussels, Belgium (Monday 3 May 1982)] Industrial Applications of Holographic Nondestructive Testing - <title>Introduction To Holography</title>

SPIE Proceedings [SPIE Industrial Applications of Holographic Nondestructive Testing - Brussels, Belgium (Monday 3 May 1982)] Industrial Applications of Holographic Nondestructive Testing - Introduction To Holography

Ebbeni, J.; Ebbeni, Jean P. L.

作者Ebbeni, J.; Ebbeni, Jean P. L.
卷第349卷
印刷ISSN0277-786X
文件大小4397.08KB
发表时间1982
DOI10.1117/12.933867
页码34-46

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