Determination of sticking probability by negative surface ionization mass spectrometry
H. Kawano; T. Gōda; H. Takeichi; T. Kenpō; Y. Kainō; Y. Hidaka
- 作者H. Kawano; T. Gōda; H. Takeichi; T. Kenpō; Y. Kainō; Y. Hidaka
- 卷第47卷
- 印刷ISSN0020-7381
- 文件大小278.99KB
- 发表时间1983
- DOI10.1016/0020-7381(83)87185-x
- 页码261-264