The importance of beam alignment and crystal tilt in high resolution electron microscopy
- 作者David J. Smith; W.O. Saxton; M.A. O'Keefe; G.J. Wood; W.M. Stobbs
- 卷第11卷
- 期第4期
- 印刷ISSN0304-3991
- 文件大小2175.78KB
- 发表时间1983
- DOI10.1016/0304-3991(83)90006-2
- 页码263-281
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