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[IRE 1983 International Electron Devices Meeting - ()] 1983 International Electron Devices Meeting - Hot-electron effects in MOSFETs

[IRE 1983 International Electron Devices Meeting - ()] 1983 International Electron Devices Meeting - Hot-electron effects in MOSFETs

Chenming Hu,

作者Chenming Hu,
文件大小408.11KB
发表时间1983
DOI10.1109/iedm.1983.190470
页码176-181

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