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[IEEE 1983 Ultrasonics Symposium - Atlanta, GA, USA (1983.10.31-1983.11.2)] 1983 Ultrasonics Symposium - Photoacoustic Measurements of Nonradiative Lifetime and Defect in Silicon Wafers

[IEEE 1983 Ultrasonics Symposium - Atlanta, GA, USA (1983.10.31-1983.11.2)] 1983 Ultrasonics Symposium - Photoacoustic Measurements of Nonradiative Lifetime and Defect in Silicon Wafers

Mikoshiba, N.; Nakamura, H.; Tsubouchi, K.

作者Mikoshiba, N.; Nakamura, H.; Tsubouchi, K.
文件大小492.22KB
发表时间1983
DOI10.1109/ultsym.1983.198145
页码685-690

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