[IRE 1983 International Electron Devices Meeting - ()] 1983 International Electron Devices Meeting - Advanced VIST device technology
- 作者Takemoto, T.; Kawakita, K.; Sakai, H.; Komeda, T.
- 文件大小389.92KB
- 发表时间1983
- DOI10.1109/iedm.1983.190438
- 页码51-54
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