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SPIE Proceedings [SPIE 26th Annual Technical Symposium - San Diego (Tuesday 24 August 1982)] Industrial and Commercial Applications of Holography - <title>Industrial Applications Of Holographic Testing</title>

SPIE Proceedings [SPIE 26th Annual Technical Symposium - San Diego (Tuesday 24 August 1982)] Industrial and Commercial Applications of Holography - Industrial Applications Of Holographic Testing

Nicholls, Donald W.; Chang, Milton

作者Nicholls, Donald W.; Chang, Milton
卷第353卷
印刷ISSN0277-786X
文件大小13101.39KB
发表时间1983
DOI10.1117/12.933947
页码33-39

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