The determination of oxide film thickness and composition on indium and chromium by decomposition of auger electron spectra

• 作者D.J. Siconolfi; R.P. Frankenthal
• 卷第24卷
• 期第2期
• 印刷ISSN0010-938X
• 文件大小356.37KB
• 发表时间1984
• DOI10.1016/0010-938x(84)90042-8