Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈111〉 and 〈100〉 orientations
- 作者A.M. Narsale; B.M. Arora
- 卷第143卷
- 印刷ISSN0167-2584
- 文件大小146.59KB
- 发表时间1984
- DOI10.1016/0167-2584(84)90634-0
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