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[IEEE IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA (November 6-10, 1994)] IEEE/ACM International Conference on Computer-Aided Design - Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits

[IEEE IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA (November 6-10, 1994)] IEEE/ACM International Conference on Computer-Aided Design - Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits

Mir, S.; Kolarik, V.; Lubaszewski, M.; Nielsen, C.; Courtois, B.

作者Mir, S.; Kolarik, V.; Lubaszewski, M.; Nielsen, C.; Courtois, B.
文件大小451.00KB
发表时间1984
DOI10.1109/iccad.1994.629857
页码486-490

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