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Inelastic scattering rate for electrons in thin aluminum films determined from the minimum frequency for microwave stimulation of superconductivity

Inelastic scattering rate for electrons in thin aluminum films determined from the minimum frequency for microwave stimulation of superconductivity

van Son, P. C.; Romijn, J.; Klapwijk, T. M.; Mooij, J. E.

期刊名称Physical Review B
作者van Son, P. C.; Romijn, J.; Klapwijk, T. M.; Mooij, J. E.
卷第29卷
期第3期
印刷ISSN0163-1829
文件大小168.57KB
发表时间1984-2-1
DOI10.1103/PhysRevB.29.1503
页码1503-1505

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