Reliability of InGaAs Photodiodes for SL Applications
- 期刊名称AT&T Technical Journal
- 作者Saul, R. H.; Chen, F. S.; Shumate, P. W.
- 卷第64卷
- 期第3期
- 印刷ISSN8756-2324
- 文件大小1228.97KB
- 发表时间1985-03
- DOI10.1002/j.1538-7305.1985.tb00450.x
- 页码861-882
同期刊推荐
AnnouncementYue, Zhong Qi; Yin, Jian-Hua · International Journal for Numerical and Analytical Methods in Geomechanics · 1999
Pharmaceutical AnalysisHanna-Brown, Melissa · Analytical Methods · 2012
Dark uncertaintyAnalytical Methods · 2012
GMOfinder—A GMO Screening DatabaseGerdes, Lars; Busch, Ulrich; Pecoraro, Sven · Food Analytical Methods · 2012
The evolution of chemometricsBrereton, Richard G. · Analytical Methods · 2013
Trends in process analytical technologyChew, Wee; Sharratt, Paul · Analytical Methods · 2010
Contents listAnalytical Methods · 2014
Front coverAnalytical Methods · 2014