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[IEEE IEEE 1985 Ultrasonics Symposium - San Francisco, CA, USA (1985.10.16-1985.10.18)] IEEE 1985 Ultrasonics Symposium - Nondestructive Observation of Microdefects in GaAs by Photo-Thermal-Radiation Technique

[IEEE IEEE 1985 Ultrasonics Symposium - San Francisco, CA, USA (1985.10.16-1985.10.18)] IEEE 1985 Ultrasonics Symposium - Nondestructive Observation of Microdefects in GaAs by Photo-Thermal-Radiation Technique

Mikoshiba, N.; Nakamura, H.; Tsubouchi, K.
  • 作者Mikoshiba, N.; Nakamura, H.; Tsubouchi, K.
  • 文件大小329.32KB
  • 发表时间1985
  • DOI10.1109/ultsym.1985.198547
  • 页码436-439
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